Special:Badtitle/NS90:«no subject» (4)

As a nonimiator, modification of citation is proposed here. The modified version is 66 words, shorter than the original version of 70 words. Instead of listing many types of  electron microscopes, application fields to which Field Emission Electron Microscopes contributed are added.

Citation of First Practical Field Emission Electron Microscope, 1972-1984
[Original] 70 words

Hitachi developed practical field emission electron source technology, under collaboration with Dr. Crewe (University of Chicago) and constructed the world’s first commercial FE-SEM (field emission scanning electron microscope) in 1972. The field emission technology enabled stable and reliable ultra-high-resolution imaging. Field emission electron microscopes, i.e., FE-SEMs, FE-TEMs, FE-STEMs and critical dimension SEMs (1984) are now widely used for advanced research and development in many fields of science, technology and industry.

[Modified] 66 words

Hitachi developed practical field emission electron source technology, under collaboration with Dr. Crewe (University of Chicago) and commercialized the world’s first field emission scanning electron microscope in 1972. This technology enabled stable and reliable ultrahigh resolution imaging and realized high performance electron microscopes. The field emission electron microscopes have been contributing to the progress in science, technology and industry, such as physics, biology and semiconductor devices.