Special:Badtitle/NS90:«no subject» (10): Difference between revisions
From ETHW
(New page: Magoun, Thank you for your suggestion. I am glad to accept it. Citation then becomes as follows. The word count is 63. Hitachi developed practical field emission electron...) |
No edit summary |
||
| Line 1: | Line 1: | ||
Magoun, | Magoun, | ||
Thank you for your suggestion. I am glad to accept it. Citation then becomes as follows. The word count is 63. | Thank you for your suggestion. I am glad to accept it. Citation then becomes as follows. The word count is surely 63. | ||
Hitachi developed practical field emission electron source technology, in collaboration with Albert Crewe (University of Chicago), and commercialized the world’s first field emission scanning electron microscope in 1972. This technology enabled stable and reliable ultrahigh resolution imaging with easy operation. Field emission electron microscopes have made invaluable contributions to the progress of science, technology and industry in physics, biology, materials, and semiconductor devices. | Hitachi developed practical field emission electron source technology, in collaboration with Albert Crewe (University of Chicago), and commercialized the world’s first field emission scanning electron microscope in 1972. This technology enabled stable and reliable ultrahigh resolution imaging with easy operation. Field emission electron microscopes have made invaluable contributions to the progress of science, technology and industry in physics, biology, materials, and semiconductor devices. | ||
I | I suppose this will be the finalized citation. I am pleased to approve it as a nominator.<br> | ||
Revision as of 11:21, 7 February 2011
Magoun,
Thank you for your suggestion. I am glad to accept it. Citation then becomes as follows. The word count is surely 63.
Hitachi developed practical field emission electron source technology, in collaboration with Albert Crewe (University of Chicago), and commercialized the world’s first field emission scanning electron microscope in 1972. This technology enabled stable and reliable ultrahigh resolution imaging with easy operation. Field emission electron microscopes have made invaluable contributions to the progress of science, technology and industry in physics, biology, materials, and semiconductor devices.
I suppose this will be the finalized citation. I am pleased to approve it as a nominator.
