Jan Czochralski publishes A New Method for the Measurement of the Crystallization Rate of Metals
From ETHW
In 1918, Jan Czochralski published the paper "Ein Neues Verfahren zur Messung des Kristallisationsgeschwindigkeit der Metalle" ("A New Method for the Measurement of the Crystallization Rate of Metals"), in which he describes a method of growing metallic monocrystals. This became the method of choice for growing high-performance materials, such as the silicon crystals used in the semiconductor computer chip industry.
