Dylan Forrest Williams
The insight provided by Dylan Forrest Williams into microwave measurements defined the most accurate measurement approaches for the low-cost testing of chips for portable wireless devices. Working with the National Institute of Standards and Technology (NIST), Dr. Williams pioneered the development of methods for determining the characteristic impedance of printed transmission lines and accurate on-wafer scattering-parameter calibrations. On-wafer measurements allow direct testing of integrated circuits (ICs) in the lab before being packaged. His work has facilitated development of the monolithic-microwave and radio-frequency IC technology behind low-cost wireless components. Dr. Williams’ work also led to the development of mismatch-corrected temporal waveform standards at NIST. These calibrations have been used to establish traceability for high-speed oscilloscopes and large-signal network analyzers.
An IEEE Fellow, Dr. Williams is an electrical engineer with the National Institute of Standards and Technology in Boulder, Colorado.